• DocumentCode
    3798527
  • Title

    Built-In Self-Test: Pass or Fail?

  • Volume
    2
  • Issue
    2
  • fYear
    1985
  • Firstpage
    17
  • Lastpage
    19
  • Keywords
    "Built-in self-test","Programmable logic arrays","Circuit testing","Costs","Circuit faults","Life testing","Logic testing","AC generators","Process design","Design automation"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1985.294854
  • Filename
    4069536
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3798527