DocumentCode :
3798564
Title :
Sampling Quality
Volume :
3
Issue :
1
fYear :
1986
Firstpage :
10
Lastpage :
11
Keywords :
"Sampling methods","Very large scale integration","Educational institutions","Routing","Design for testability","System testing","Design automation","Automatic testing","Silicon compiler","Computer aided manufacturing"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1986.294912
Filename :
4069723
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3798564
