DocumentCode

3798604

Title

A D&T Tutorial

Volume

3

Issue

6

fYear

1986

Firstpage

43

Lastpage

50

Keywords

"Tutorials","Circuit faults","Programmable logic arrays","Logic testing","Decoding","MOS devices","Circuit testing","Automatic testing"

Journal_Title

IEEE Design & Test of Computers

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.1986.295053

Filename

4069900