DocumentCode :
3798604
Title :
A D&T Tutorial
Volume :
3
Issue :
6
fYear :
1986
Firstpage :
43
Lastpage :
50
Keywords :
"Tutorials","Circuit faults","Programmable logic arrays","Logic testing","Decoding","MOS devices","Circuit testing","Automatic testing"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1986.295053
Filename :
4069900
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3798604
