DocumentCode :
3798639
Title :
Switch-Level Techniques
Volume :
4
Issue :
4
fYear :
1987
Firstpage :
15
Lastpage :
16
Keywords :
"Switches","Circuit faults","Circuit testing","Test pattern generators","Circuit simulation","Design automation","Automatic test pattern generation","Switching circuits","Very large scale integration","Electrical fault detection"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1987.295143
Filename :
4070013
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3798639
