A X-band probe for phaseless near-field measurements

Author

Costanzo, S. ; Massa, Giuseppe Di ; Migliore, Marco Donald

Author_Institution

Dipt. di Elettronica, Calabria Univ., Italy

Volume

1

fYear

2002

fDate

2002

Firstpage

274

Abstract

The design of a multifrequency integrated probe performing phaseless near-field measurements is presented. Two X-band rectangular waveguides directly connected to a microstrip circuit are used for making the near-field scanning which provides the necessary amplitude information. An interferometric algorithm is applied in conjunction with a minimization procedure to obtain the unknown near-field phase. A prototype of the probe has been realized and successfully tested on a standard X-band pyramidal horn.

Keywords

antenna testing; horn antennas; interferometry; microwave antennas; microwave measurement; minimisation; multifrequency antennas; phase measurement; probes; rectangular waveguides; scanning antennas; X-band probe; amplitude information; interferometric algorithm; microstrip circuit; minimization procedure; multifrequency integrated probe; near-field scanning; phaseless near-field measurements; pyramidal horn; rectangular waveguides; unknown near-field phase; Circuits; Diodes; Frequency; Microstrip; Patch antennas; Phase measurement; Probes; Rectangular waveguides; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 2002. IEEE

Print_ISBN

0-7803-7330-8

Type

conf

DOI

10.1109/APS.2002.1016301

Filename

1016301