مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3800150

Title :

Naecon ´74

Issue :

fYear :

1974

Keywords :

"Vehicles","FETs","EPROM","Spectrogram","Magnetic semiconductors","Message systems","Forensics","Error analysis","Semiconductor device reliability","Costs"

Journal_Title :

IEEE Transactions on Aerospace and Electronic Systems

Publisher :

ieee

ISSN :

0018-9251

Type :

jour

DOI :

10.1109/TAES.1974.307841

Filename :

4101272

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3800150