• DocumentCode
    380019
  • Title

    Comparative characteristics studies on on-chip single- and double-level square inductors

  • Author

    Yin, W.Y. ; Gan, Y.B. ; Pan, S.J. ; Li, L.W. ; Wu, B. ; Ooi, O.B. ; Kooi, P.S.

  • Author_Institution
    Temasek Labs., Nat. Univ. of Singapore, Singapore
  • Volume
    1
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    352
  • Abstract
    Detailed experimental investigations are carried out in this paper to show the inductance, Q-factor as well as resonant frequency of on-chip square single- and double-level inductors on silicon substrates. Based on the equivalent circuit model developed and the S-parameters measured using a de-embedding technique, inductances, Q-factors and resonant frequencies of these inductors are determined and compared with one another. Parametric studies are carried out to show the effects of both strip length and inner empty area on the coupling capacitance and resonant frequency of these inductors, and some scalable formulas are derived for extrapolating inductance and resonant frequency of other inductors. It is demonstrated that in the double-level cases very strong self-inductor resonance can take place with lower resonant frequency, and Q-factor is degraded rapidly.
  • Keywords
    Q-factor measurement; S-parameters; capacitance measurement; equivalent circuits; inductance measurement; inductors; resonance; silicon; substrates; Q-factor; S-parameter measurement; coupling capacitance; de-embedding technique; double-level square inductors; equivalent circuit model; inductance; inner empty area; on-chip single-level square inductors; resonant frequency; scalable formulas; self-inductor resonance; silicon substrates; strip length; Equivalent circuits; Frequency measurement; Inductance; Inductors; Parametric study; Q factor; Resonant frequency; Scattering parameters; Silicon; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2002. IEEE
  • Print_ISBN
    0-7803-7330-8
  • Type

    conf

  • DOI
    10.1109/APS.2002.1016320
  • Filename
    1016320