DocumentCode :
3800210
Title :
Abstracts IEEE 1975 Student Papers
Issue :
1
fYear :
1976
Keywords :
"Abstracts","Conductivity measurement","Skin","Lamps","Admittance","Circuit testing","Instruments","Logic arrays","Switches","Logic devices"
Journal_Title :
IEEE Transactions on Aerospace and Electronic Systems
Publisher :
ieee
ISSN :
0018-9251
Type :
jour
DOI :
10.1109/TAES.1976.308225
Filename :
4101601
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3800210