• DocumentCode
    3801553
  • Title

    Modelling and Measuring Reflection Due to Flat Dielectric Surfaces at 5.8 GHz

  • Author

    Iigo Cuinas;David Martinez;Manuel Garca Sanchez;Ana Vzquez Alejos

  • Author_Institution
    Departamento Teorfa do Sinal e Comunicacions, Vigo Univ.
  • Volume
    55
  • Issue
    4
  • fYear
    2007
  • Firstpage
    1139
  • Lastpage
    1147
  • Abstract
    Indoor radio channel planning tools implement different models to simulate propagation mechanisms such as transmission or reflection. The specular reflection formulation is commonly used instead of more complete scattering models. This happens because its coding is less complicated and the software runs faster than when considering reflection in all directions, not yet specular. In this paper, results from measurements are presented, consisting of the effect of constructive walls on an oblique incident wave. These experimental outcomes are modelled by means reflection pattern computations. Physical optics scattering model is used in its classical formulation, and it is then modified to take into account antenna pattern effects in the measurements. The comparison between measurements and simulations is also presented, showing good agreement. Measurements show that low reflective walls produce reflections in several directions across the incidence region. In these situations, the use of algorithms that compute reflection pattern, instead of just specular reflection coefficients, will lead to better agreement with actual results
  • Keywords
    "Dielectric measurements","Optical reflection","Antenna measurements","Optical surface waves","Optical scattering","Electromagnetic scattering","Frequency","Electromagnetic reflection","Computer vision","Physical optics"
  • Journal_Title
    IEEE Transactions on Antennas and Propagation
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2007.893399
  • Filename
    4148064