DocumentCode
380229
Title
A simple procedure for obtaining the scattering matrix of a two-port junction in the case of incompatibility with ports of VNA
Author
Szczypka, Zbigniew
Author_Institution
Telecommun. Res. Inst., Warsaw, Poland
Volume
1
fYear
2002
fDate
2002
Firstpage
306
Abstract
A procedure based on the fundamentals of bilinear-transformation is presented for obtaining the scattering matrix of a two-port junction from input reflection coefficients measured by the use of a VNA when the output port of the junction, which is incompatible with the port of the VNA, is loaded one after another in three short circuited lines of different but known electrical lengths. The method is bandpass, what makes it very useful.
Keywords
S-matrix theory; S-parameters; microwave measurement; network analysers; two-port networks; waveguide junctions; VNA measurement; input reflection coefficients; microwave vector network analyzer; scattering matrix; two-port junction; Computer aided software engineering; Electric variables measurement; Frequency measurement; Length measurement; Measurement standards; Microwave devices; Reflection; Scattering; Transmission line matrix methods; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwaves, Radar and Wireless Communications, 2002. MIKON-2002. 14th International Conference on
Print_ISBN
83-906662-5-1
Type
conf
DOI
10.1109/MIKON.2002.1017857
Filename
1017857
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