Title :
A simple procedure for obtaining the scattering matrix of a two-port junction in the case of incompatibility with ports of VNA
Author :
Szczypka, Zbigniew
Author_Institution :
Telecommun. Res. Inst., Warsaw, Poland
Abstract :
A procedure based on the fundamentals of bilinear-transformation is presented for obtaining the scattering matrix of a two-port junction from input reflection coefficients measured by the use of a VNA when the output port of the junction, which is incompatible with the port of the VNA, is loaded one after another in three short circuited lines of different but known electrical lengths. The method is bandpass, what makes it very useful.
Keywords :
S-matrix theory; S-parameters; microwave measurement; network analysers; two-port networks; waveguide junctions; VNA measurement; input reflection coefficients; microwave vector network analyzer; scattering matrix; two-port junction; Computer aided software engineering; Electric variables measurement; Frequency measurement; Length measurement; Measurement standards; Microwave devices; Reflection; Scattering; Transmission line matrix methods; Transmission line measurements;
Conference_Titel :
Microwaves, Radar and Wireless Communications, 2002. MIKON-2002. 14th International Conference on
Print_ISBN :
83-906662-5-1
DOI :
10.1109/MIKON.2002.1017857
