Title :
Bounds on permittivity calculations using the TE01δ dielectric resonator
Author :
Krupka, J. ; Derzakowski, K. ; Abramowicz, A. ; Riddle, B. ; Baker-Jarvis, J. ; Clarke, R.N. ; Rochard, O.C.
Author_Institution :
Inst. of Microelectron. & Optoelectron., Warsaw, Poland
Abstract :
The use of both mode-matching and Rayleigh-Ritz numerical techniques for complex permittivity calculations using a TE01δ mode dielectric resonator allows the determination of lower and upper bounds of the permittivity. The maximum difference of the relative permittivity obtained from the two techniques does not exceed 0.125% for a cavity-to-sample volume ratio from 1 to 64 and relative permittivity values in the range of 1 to 100. These results were obtained by employing 126 basis functions with the Rayleigh-Ritz technique and 10 basis functions with the mode-matching method. It is possible to increase the computational accuracy of the calculations by increasing the number of basis functions.
Keywords :
Rayleigh-Ritz methods; dielectric loss measurement; dielectric resonators; measurement uncertainty; microwave measurement; mode matching; permittivity measurement; Rayleigh-Ritz numerical techniques; TE01δ dielectric resonator permittivity measurements; basis functions; calculation computational accuracy; cavity-to-sample volume ratio; dielectric loss tangent; low-loss dielectric materials; measurement uncertainty; microwave frequency complex permittivity measurement; mode-matching numerical techniques; permittivity lower/upper bounds; permittivity measurement calculation bounds; relative permittivity; Dielectric losses; Electromagnetic fields; Measurement uncertainty; Mode matching methods; Permittivity measurement; Resonance; Resonant frequency; Tellurium; Testing; Upper bound;
Conference_Titel :
Microwaves, Radar and Wireless Communications, 2002. MIKON-2002. 14th International Conference on
Print_ISBN :
83-906662-5-1
DOI :
10.1109/MIKON.2002.1017874
