DocumentCode :
3804157
Title :
Classification of Faults and Switching Events by Inductive Reasoning and Expert System Methodology
Author :
C. J. Kim;B. Don Russell
Author_Institution :
Texas A&M University College Station, Texas
Volume :
9
Issue :
7
fYear :
1989
Firstpage :
48
Lastpage :
49
Keywords :
"Expert systems","Entropy","Probability","Pattern recognition","Impedance","Logic","Ferroresonance","Student members","Senior members","Fluid flow measurement"
Journal_Title :
IEEE Power Engineering Review
Publisher :
ieee
ISSN :
0272-1724
Type :
jour
DOI :
10.1109/MPER.1989.4310798
Filename :
4310798
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3804157