• DocumentCode
    3804768
  • Title

    Correction to "A Technique for Determination of Loss, Reflection, and Repeatability in Waveguide Flanged Couplings"

  • Author

    Peter J. Skilton

  • Volume
    24
  • Issue
    3
  • fYear
    1975
  • Firstpage
    279
  • Lastpage
    279
  • Keywords
    "Reflection","Fluid flow measurement","Electric variables measurement","Dielectric measurements","Microwave measurements","High-K gate dielectrics","Dielectric thin films","Laboratories","Microwave technology","Manufacturing"
  • Journal_Title
    IEEE Transactions on Instrumentation and Measurement
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1975.4314431
  • Filename
    4314431