DocumentCode :
3804887
Title :
A New Measurement Technique for MOS Capacitors
Volume :
34
Issue :
5
fYear :
1985
Firstpage :
682
Lastpage :
682
Keywords :
"Measurement techniques","MOS capacitors","Voltage","Dielectric measurements","Dielectrics and electrical insulation","Solid state circuits","Switched capacitor circuits","Capacitance measurement","Coaxial components","Filters"
Journal_Title :
IEEE Transactions on Instrumentation and Measurement
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1985.4315435
Filename :
4315435
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3804887