DocumentCode :
3805248
Title :
Breakdown in Abrupt Silicon Junctions
Volume :
11
Issue :
1
fYear :
1968
Firstpage :
77
Lastpage :
78
Journal_Title :
IEEE Transactions on Education
Publisher :
ieee
ISSN :
0018-9359
Type :
jour
DOI :
10.1109/TE.1968.4320340
Filename :
4320340
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3805248
