DocumentCode :
3806032
Title :
Radiation Testing of an 8-Bit CMOS Microprocessor
Volume :
22
Issue :
5
fYear :
1975
Firstpage :
2120
Lastpage :
2120
Keywords :
"Testing","Microprocessors","Registers","Frequency","Clocks","CMOS logic circuits","CMOS process","Performance evaluation","Degradation","CMOS technology"
Journal_Title :
IEEE Transactions on Nuclear Science
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1975.4328075
Filename :
4328075
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3806032
