DocumentCode :
3806282
Title :
Historical notes and recollections
Volume :
33
Issue :
6
fYear :
1986
Keywords :
"Radiation effects","Radiation hardening","CMOS technology","Ionizing radiation","Very large scale integration","Very high speed integrated circuits","Annealing","Forward contracts","Pressing","CMOS process"
Journal_Title :
IEEE Transactions on Nuclear Science
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1986.4334574
Filename :
4334574
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3806282
