DocumentCode :
3806283
Title :
Discovery of Heavy-Ion Induced Latchup in CMOS/EPI Devices
Volume :
33
Issue :
6
fYear :
1986
Firstpage :
1695
Lastpage :
1696
Keywords :
"Aircraft propulsion","Protection","Laboratories","Satellites","Space vehicles","Cyclotrons","Aerospace testing","Ionizing radiation","Temperature","Microprocessors"
Journal_Title :
IEEE Transactions on Nuclear Science
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1986.4334666
Filename :
4334666
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3806283
