Title :
Inference and labeling of metric-induced network topologies
Author :
Bestavros, Azer ; Byers, John ; Harfoush, Khaled
Author_Institution :
Dept. of Comput. Sci., Boston Univ., MA, USA
Abstract :
The development and deployment of distributed network-aware applications and services require the ability to compile and maintain a model of the underlying network resources with respect to (one or more) characteristic properties of interest. To be manageable, such models must be compact, and to be general-purpose, they should enable a representation of properties along temporal, spatial, and measurement resolution dimensions. We propose MINT - a general framework for the construction of such metric-induced models using end-to-end measurements. We present the basic theoretical underpinnings of MINT for a broad class of metrics obeying certain properties. We instantiate MINT for two metrics of interest, namely packet loss rates and bottleneck bandwidth. For the loss rate metric, we leverage previously proposed end-to-end techniques for the estimation of shared losses to characterize loss topologies. We present results of simulations and Internet measurements that confirm the effectiveness and robustness of our loss topology constructions over a wide range of network conditions.
Keywords :
Internet; network topology; packet switching; performance evaluation; Internet measurements; MINT; bottleneck bandwidth; distributed network-aware applications; distributed network-aware services; end-to-end measurements; inference; labeling; loss topologies; measurement resolution; metric-induced models; metric-induced network topologies; network resources; packet loss rates; shared losses; simulation results; spatial dimension; temporal dimension; Application software; Bandwidth; Jitter; Joining processes; Labeling; Loss measurement; Network servers; Network topology; Resource management; Web server;
Conference_Titel :
INFOCOM 2002. Twenty-First Annual Joint Conference of the IEEE Computer and Communications Societies. Proceedings. IEEE
Print_ISBN :
0-7803-7476-2
DOI :
10.1109/INFCOM.2002.1019308