DocumentCode :
3806559
Title :
1982 NSREC Short Course on Radiation Effects and System Hardening
Volume :
29
Issue :
6
fYear :
1982
Firstpage :
1434
Lastpage :
1435
Keywords :
"Radiation effects","Radiation hardening","EMP radiation effects","Laboratories","Ionization","Testing","Transient analysis","Integrated circuit technology","Optical materials","Silicon"
Journal_Title :
IEEE Transactions on Nuclear Science
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1982.4336375
Filename :
4336375
Link To Document :
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