Title :
A DEPFET Based Beam Telescope With Submicron Precision Capability
Author :
J. J. Velthuis;Z. Drasal;G. Hanninger;R. Kohrs;M. Mathes;L. Reuen;D. Scheirich;L. Andricek;I. Carbonell Pascual;X. Chen;Z. Dolezal;P. Fischer;A. Frey;J.A. Fuster;M. Koch;P. Kodys;P. Kvasnicka;H. Kruger;C. Lacasta Llacer;P. Lodomez;H. G. Moser;I. Peric;A.
Author_Institution :
Bonn Univ., Bonn, Germany
Abstract :
For the detection of secondary vertices of long lived particles containing bottom and charm quarks at the International Linear Collider (ILC), a DEPFET pixel detector is one of the technologically favored options. In a DEPFET sensor a MOSFET pixel detector is integrated on a sidewards depleted silicon bulk sensor, thus combining the advantages of a fully depleted silicon sensor with in-pixel amplification. DEPFET pixel matrices have been characterized in a high energy particle beam. Since the DEPFET is a very high precision device, given its large S/N (> 100) and small pixel size (36 ? 22 ?m2), a DEPFET based pixel telescope consisting of 5 DEPFETs has been developed. The uncertainty on the predicted position for a device under test (DUT) positioned inside the telescope was found to be 1.4 ?m with the existing device, due to the limited performance of two of the five DEPFET planes. A DEPFET telescope built of 5 modules equivalent to the best plane presented here, would have a track extrapolation error as low as 0.65 ?m at the DUT plane.
Keywords :
"Telescopes","Sensor phenomena and characterization","Detectors","Silicon","Space technology","MOSFET circuits","Particle beams","Uncertainty","Testing","Extrapolation"
Journal_Title :
IEEE Transactions on Nuclear Science
DOI :
10.1109/TNS.2007.914031