DocumentCode :
3807582
Title :
Discussion
Volume :
76
Issue :
3
fYear :
1957
Firstpage :
284
Lastpage :
284
Keywords :
"Companies","Integrated circuit reliability","Circuit faults","Reliability engineering","Control systems","Monitoring","Wire","indium","beryllium","controller area networks","operations research","Reliability"
Journal_Title :
Transactions of the American Institute of Electrical Engineers. Part III: Power Apparatus and Systems
Publisher :
ieee
ISSN :
0097-2460
Type :
jour
DOI :
10.1109/AIEEPAS.1957.4499549
Filename :
4499549
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3807582