مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3807613

Title :

Discussion

Volume :

Issue :

fYear :

1957

Firstpage :

591

Lastpage :

592

Keywords :

"Microwave circuits","Circuit faults","Microwave devices","Circuit breakers","Relays","Reliability","Microwave communication","indium","beryllium","arsenic","controller area networks","astatine"

Journal_Title :

Transactions of the American Institute of Electrical Engineers. Part III: Power Apparatus and Systems

Publisher :

ieee

ISSN :

0097-2460

Type :

jour

DOI :

10.1109/AIEEPAS.1957.4499617

Filename :

4499617

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3807613