DocumentCode :
3808806
Title :
Discussion of ``Relationship of X/R, Ip and I´rms to Asymmetry in Resistance/Reactance Circuits´´
Issue :
5
fYear :
1986
Firstpage :
964
Lastpage :
964
Keywords :
"Circuit faults","Thermal stresses","Linear systems","Heating","Reactive power"
Journal_Title :
IEEE Transactions on Industry Applications
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.1986.4504820
Filename :
4504820
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3808806
