Title :
Classification of sleep stages in infants: a neuro fuzzy approach
Author :
Heiss, J.E. ; Held, C.M. ; Estevez, P.A. ; Perez, C.A. ; Holzmann, C.A. ; Perez, J.P.
Author_Institution :
Dept. of Electr. Eng., Chile Univ., Santiago, Chile
Abstract :
An ANFIS based neuro-fuzzy system to classify sleep-waking states and stages in healthy infants has been developed. The classifier takes rive input patterns identified from polysomnographic recordings on 20 s frames and assigns them to one out of rive possible classes (WA, NREM-I, NREM-II, NREM-III&IV or REM). Eight polysomnographic recordings of healthy infants were studied, making a total of 3510 frames. Of these, four recordings were used for training, two for validation and two for testing. Results on the testing data achieved on average 88.2% of expert agreement in sleep-waking state-stage classification. These results were compared with the ones obtained using a multi-layer perceptron neural network (87.3%) and by applying the expert´s rules for sleep classification (86.7%). The neuro-fuzzy approach also rendered fuzzy classification rules, which were analyzed and compared with the expert´s rules.
Keywords :
electroencephalography; electromyography; fuzzy neural nets; learning (artificial intelligence); medical expert systems; medical signal processing; paediatrics; signal classification; sleep; ANFIS based neuro-fuzzy system; automated computer scoring; automated rule generation; electroencephalogram; electromyogram; electrooculogram; expert system classification; fuzzy classification rules; fuzzy membership functions; healthy infants; polysomnographic recordings; pruning algorithm; rapid eye movements; sigmoidal fuzzification functions; sleep stages classification; sleep-waking states; supervised learning; Databases; Electroencephalography; Fuzzy neural networks; Multi-layer neural network; Multilayer perceptrons; Neural networks; Pediatrics; Signal generators; Sleep; Testing;
Conference_Titel :
Engineering in Medicine and Biology Society, 2001. Proceedings of the 23rd Annual International Conference of the IEEE
Print_ISBN :
0-7803-7211-5
DOI :
10.1109/IEMBS.2001.1020553