DocumentCode

3809654

Title

Book review: Reliability and Degradation of Semiconductor Devices and Circuits

Author

C. Johnston

Volume

129

Issue

5

fYear

1982

fDate

10/1/1982 12:00:00 AM

Firstpage

184

Journal_Title

IEE Proceedings I - Solid-State and Electron Devices

Publisher

iet

ISSN

0143-7100

Type

jour

DOI

10.1049/ip-i-1.1982.0040

Filename

4642640