DocumentCode :
3811779
Title :
List of Reviewers
Issue :
2
fYear :
1982
Firstpage :
224
Lastpage :
225
Keywords :
IEEE
Journal_Title :
IEEE Transactions on Pattern Analysis and Machine Intelligence
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.1982.4767231
Filename :
4767231
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3811779
