مرکز منطقه ای اطلاع رساني علوم و فناوري - Erratum: Contactless nondestructive technique for the measurement of minority-carrier lifetime and diffusion length in silicon

DocumentCode :

3812588

Title :

Erratum: Contactless nondestructive technique for the measurement of minority-carrier lifetime and diffusion length in silicon

Author :

J.C. White;T.F. Unter;J.G. Smith

Volume :

Issue :

fYear :

1977

fDate :

11/1/1977 12:00:00 AM

Firstpage :

192

Journal_Title :

IEE Journal on Solid-State and Electron Devices

Publisher :

iet

ISSN :

0308-6968

Type :

jour

DOI :

10.1049/ij-ssed:19770030

Filename :

4807545

Link To Document :