DocumentCode :
3812593
Title :
Erratum: Fast current pulse m.o.s. deep-depletion technique for profiling thin epitaxial and ion-implanted layers
Volume :
2
Issue :
6
fYear :
1978
fDate :
11/1/1978 12:00:00 AM
Firstpage :
224
Journal_Title :
IEE Journal on Solid-State and Electron Devices
Publisher :
iet
ISSN :
0308-6968
Type :
jour
DOI :
10.1049/ij-ssed:19780060
Filename :
4807612
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3812593
