DocumentCode :
3812825
Title :
IMS Technical Committee Reports 31-38 from the Spring of 2008
Author :
Kang Lee
Author_Institution :
National Institute of Standards and Technology
Volume :
12
Issue :
2
fYear :
2009
Firstpage :
52
Lastpage :
53
Keywords :
"Springs","Chapters","Haptic interfaces","Inspection","Particle measurements","Plugs","NASA","Intelligent sensors","Instrumentation and measurement","Instruments"
Journal_Title :
IEEE Instrumentation & Measurement Magazine
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2009.4811141
Filename :
4811141
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3812825
