DocumentCode
381323
Title
Fault injection experiment results in space borne parallel application programs
Author
Some, Raphael R. ; Kim, Won S. ; Khanoyan, Garen ; Callum, Leslie ; Agrawal, Anil ; Beahan, John J. ; Shamilian, Arshaluys ; Nikora, Allen
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume
5
fYear
2002
fDate
2002
Firstpage
85224
Abstract
Development of the REE Commercial-Off-The-Shelf (COTS) based space-borne supercomputer requires a detailed knowledge of system behavior in the presence of Single Event Upset (SEU) induced faults. When combined with a hardware radiation fault model and mission environment data in a medium grained system model, experimentally obtained fault behavior data can be used to: predict system reliability, availability and performance; determine optimal fault detection methods and boundaries; and define high ROI fault tolerance strategies. The REE project has developed a fault injection suite of tools and a methodology for experimentally determining system behavior statistics in the presence of application level SEU induced transient faults. Initial characterization of science data application code for an autonomous Mars Rover geology application indicates that this code is relatively insensitive to SEUs and thus can be made highly immune to application level faults with relatively low overhead strategies.
Keywords
aerospace computing; fault tolerant computing; parallel machines; parallel programming; radiation effects; software performance evaluation; software reliability; REE COTS based space-borne supercomputer; SEU induced faults; application level SEU induced transient faults; autonomous Mars Rover geology application; fault behavior data; fault injection tool suite; fault tolerance strategies; hardware radiation fault model; medium grained system model; mission environment data; optimal fault detection methods; single event upsets; space borne parallel application programs; system availability; system behavior statistics; system performance; system reliability; Availability; Fault detection; Fault tolerant systems; Hardware; Mars; Predictive models; Reliability; Single event upset; Statistics; Supercomputers;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference Proceedings, 2002. IEEE
Print_ISBN
0-7803-7231-X
Type
conf
DOI
10.1109/AERO.2002.1035379
Filename
1035379
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