• DocumentCode
    381323
  • Title

    Fault injection experiment results in space borne parallel application programs

  • Author

    Some, Raphael R. ; Kim, Won S. ; Khanoyan, Garen ; Callum, Leslie ; Agrawal, Anil ; Beahan, John J. ; Shamilian, Arshaluys ; Nikora, Allen

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    5
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    85224
  • Abstract
    Development of the REE Commercial-Off-The-Shelf (COTS) based space-borne supercomputer requires a detailed knowledge of system behavior in the presence of Single Event Upset (SEU) induced faults. When combined with a hardware radiation fault model and mission environment data in a medium grained system model, experimentally obtained fault behavior data can be used to: predict system reliability, availability and performance; determine optimal fault detection methods and boundaries; and define high ROI fault tolerance strategies. The REE project has developed a fault injection suite of tools and a methodology for experimentally determining system behavior statistics in the presence of application level SEU induced transient faults. Initial characterization of science data application code for an autonomous Mars Rover geology application indicates that this code is relatively insensitive to SEUs and thus can be made highly immune to application level faults with relatively low overhead strategies.
  • Keywords
    aerospace computing; fault tolerant computing; parallel machines; parallel programming; radiation effects; software performance evaluation; software reliability; REE COTS based space-borne supercomputer; SEU induced faults; application level SEU induced transient faults; autonomous Mars Rover geology application; fault behavior data; fault injection tool suite; fault tolerance strategies; hardware radiation fault model; medium grained system model; mission environment data; optimal fault detection methods; single event upsets; space borne parallel application programs; system availability; system behavior statistics; system performance; system reliability; Availability; Fault detection; Fault tolerant systems; Hardware; Mars; Predictive models; Reliability; Single event upset; Statistics; Supercomputers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference Proceedings, 2002. IEEE
  • Print_ISBN
    0-7803-7231-X
  • Type

    conf

  • DOI
    10.1109/AERO.2002.1035379
  • Filename
    1035379