Title :
Insertion loss reduction by optimization of waveguide perturbations
Author :
Venkatesh, Shalini ; DePue, Marshall ; Okano, Hiroaki ; Uetsuka, Hisato
Author_Institution :
Agilent Labs., Agilent Technol., Palo Alto, CA, USA
Abstract :
We describe a method to significantly decrease insertion loss in waveguide-based devices, including optical cross-connects. Reductions as large as 3 dB are obtained in 32×32 switches by optimizing the dielectric perturbations.
Keywords :
integrated optoelectronics; optical communication equipment; optical interconnections; optical losses; optical planar waveguides; optimisation; dielectric perturbations optimization; insertion loss reduction; optical communications switches; optical cross-connects; optimization; planar lightwave circuit-based devices; waveguide perturbations; waveguide-based devices; Dielectrics; Etching; Insertion loss; Interference; Laboratories; Optical devices; Optical losses; Optical sensors; Optical switches; Optical waveguides;
Conference_Titel :
Optical Fiber Communication Conference and Exhibit, 2002. OFC 2002
Print_ISBN :
1-55752-701-6
DOI :
10.1109/OFC.2002.1036753
