• DocumentCode
    3816305
  • Title

    D&T Interview

  • Volume
    1
  • Issue
    2
  • fYear
    1984
  • Firstpage
    110
  • Lastpage
    115
  • Keywords
    "Interviews","Logic design","Automatic testing","Semiconductor device testing","Logic testing","Circuit testing","Design methodology","Computer aided manufacturing","Nonhomogeneous media"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1984.5005622
  • Filename
    5005622
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3816305