DocumentCode
3816323
Title
D&T Interview
Volume
1
Issue
4
fYear
1984
Firstpage
15
Lastpage
23
Keywords
"Interviews","Microprocessors","Industrial control","Lead compounds","MOS devices","Microcontrollers","Integrated circuit packaging","Read only memory","Read-write memory"
Journal_Title
IEEE Design & Test of Computers
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1984.5005683
Filename
5005683
Link To Document