• DocumentCode
    3816323
  • Title

    D&T Interview

  • Volume
    1
  • Issue
    4
  • fYear
    1984
  • Firstpage
    15
  • Lastpage
    23
  • Keywords
    "Interviews","Microprocessors","Industrial control","Lead compounds","MOS devices","Microcontrollers","Integrated circuit packaging","Read only memory","Read-write memory"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1984.5005683
  • Filename
    5005683