Title :
The StarLight metrology subsystem
Author :
Dubovitsky, Serge ; Lay, Oliver P. ; Abramovici, Alexander ; Hawley, James G. ; Kuhnert, Andreas C. ; Mulder, Jerry L. ; Asbury, Cheryl G.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
We describe a metrology subsystem for NASA´s StarLight mission, a space-based separated-spacecraft stellar interferometer. It consists of dual-target linear metrology, based on a heterodyne interferometer with carrier phase modulation, and angular metrology designed to sense the pointing of the laser beam. The dual-target operation enables one metrology beam to sense displacement of two targets independently. We present the current design, breadboard implementation of the metrology subsystem in a stellar interferometer testbed and the present state of development of flight qualifiable subsystem components.
Keywords :
aerospace instrumentation; artificial satellites; astronomical instruments; displacement measurement; extrasolar planets; light interferometers; measurement by laser beam; phase modulation; NASA StarLight mission; StarLight metrology subsystem; angular metrology; carrier phase modulation; displacement sensing; dual-target linear metrology; flight qualifiable subsystem components; heterodyne interferometer; laser beam pointing; separated-spacecraft stellar interferometer; space-based stellar interferometer; stellar interferometer testbed; Delay lines; Extraterrestrial measurements; Frequency measurement; Length measurement; Metrology; Optical interferometry; Optical mixing; Optical sensors; Space technology; Space vehicles;
Conference_Titel :
Aerospace Conference Proceedings, 2002. IEEE
Print_ISBN :
0-7803-7231-X
DOI :
10.1109/AERO.2002.1036886
