مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3817234

Title :

Discussion

Author :

F. A. Byles

Volume :

Issue :

fYear :

1929

Firstpage :

811

Lastpage :

811

Keywords :

"Regulators","Circuit testing","Tungsten","Life testing","Time measurement","Frequency","Laboratories","Voltage measurement","Transformer cores","Resistors"

Journal_Title :

Transactions of the American Institute of Electrical Engineers

Publisher :

ieee

ISSN :

0096-3860

Type :

jour

DOI :

10.1109/T-AIEE.1929.5055296

Filename :

5055296

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3817234