DocumentCode :
3817241
Title :
Discussion
Author :
R. L. McCoy
Volume :
48
Issue :
3
fYear :
1929
Firstpage :
893
Lastpage :
895
Keywords :
"Fuses","Circuit testing","Flashover","Assembly","System testing","Surges","Insulation","Materials testing","Conductivity","Conducting materials"
Journal_Title :
Transactions of the American Institute of Electrical Engineers
Publisher :
ieee
ISSN :
0096-3860
Type :
jour
DOI :
10.1109/T-AIEE.1929.5055312
Filename :
5055312
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3817241
