DocumentCode :
3817387
Title :
Discussion
Author :
E. J. Rutan
Volume :
49
Issue :
4
fYear :
1930
Firstpage :
1335
Lastpage :
1338
Keywords :
"Instruments","Frequency","Costs","Electron tubes","Tellurium","Capacitors","Voltage","Circuit testing","Joining processes","System testing"
Journal_Title :
Transactions of the American Institute of Electrical Engineers
Publisher :
ieee
ISSN :
0096-3860
Type :
jour
DOI :
10.1109/T-AIEE.1930.5055664
Filename :
5055664
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3817387
