DocumentCode :
3817421
Title :
Discussion
Author :
H. M. Wilcox
Volume :
50
Issue :
1
fYear :
1931
Firstpage :
238
Lastpage :
239
Keywords :
"Circuit testing","Voltage","Circuit breakers","System testing","Laboratories","Distributed parameter circuits","Logic testing","Frequency","Capacity planning","Equations"
Journal_Title :
Transactions of the American Institute of Electrical Engineers
Publisher :
ieee
ISSN :
0096-3860
Type :
jour
DOI :
10.1109/T-AIEE.1931.5055769
Filename :
5055769
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3817421
