مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3817514

Title :

Discussion

Author :

Leo J. Berberich

Volume :

Issue :

fYear :

1932

Firstpage :

210

Lastpage :

213

Keywords :

"Bridge circuits","Equations","Power measurement","Frequency measurement","Insulation","Dielectric measurements","Dielectric losses","Circuit testing","Coils","Detectors"

Journal_Title :

Transactions of the American Institute of Electrical Engineers

Publisher :

ieee

ISSN :

0096-3860

Type :

jour

DOI :

10.1109/T-AIEE.1932.5056049

Filename :

5056049

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3817514