DocumentCode :
3817525
Title :
Discussion
Author :
J. B. Whitehead
Volume :
51
Issue :
2
fYear :
1932
Firstpage :
408
Lastpage :
409
Keywords :
"Glass","Breakdown voltage","Conducting materials","Temperature","Electric breakdown","Crystalline materials","Materials testing","Dielectric materials","Dielectric breakdown","Insulation"
Journal_Title :
Transactions of the American Institute of Electrical Engineers
Publisher :
ieee
ISSN :
0096-3860
Type :
jour
DOI :
10.1109/T-AIEE.1932.5056085
Filename :
5056085
Link To Document :
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