Title :
Silicon micromechanical structures fabricated by electrochemical process
Author :
Dantas, Michel O S ; Galeazzo, Elisabete ; Pees, H.E.M. ; Fernandez, Francisco Javier R
Author_Institution :
Lab. de Microelectron., Sao Paulo Univ., Brazil
Abstract :
Silicon (Si) micromechanical structures were fabricated by means of sacrificial layers defined with porous silicon (PS) and masked by hydrogen ion implantation with adequate thermal annealing. The fabrication process to remove the PS layers with diluted KOH at room temperature does not cause damage in remaining Si microstructures which have less than 1 μm thickness controlled by the anodization time.
Keywords :
annealing; anodisation; elemental semiconductors; etching; ion implantation; micromachining; micromechanical devices; porous semiconductors; silicon; Si; anodization time; electrochemical process; etching; ion implantation; micromachining; micromechanical structures; sacrificial layers; thermal annealing; Annealing; Electrochemical processes; Fabrication; Hydrogen; Ion implantation; Micromechanical devices; Microstructure; Silicon; Temperature control; Thickness control;
Conference_Titel :
Sensors, 2002. Proceedings of IEEE
Print_ISBN :
0-7803-7454-1
DOI :
10.1109/ICSENS.2002.1037163