Title :
Investigation on different passivation technologies for thin film sensors on ceramic substrates
Author :
Schmid, U. ; Krotz, G.
Author_Institution :
Dept. SC/IRT/LG-MX, EADS Deutschland GmbH, Munich, Germany
Abstract :
A proper passivation technology for thin film sensor elements, exposed to the harsh environmental conditions of an automotive injection system, is a critical factor for a long-term stable and reliable operation of the device. For thermal mass flow sensors, diamond or diamond-like coatings promise excellent thermal material properties with a low influence on the sensor characteristics. With an arc discharge plasma jet CVD technology, however, no closed surface characteristics for the passivation layer could be obtained on LTC (Low Temperature Cofired) ceramics, which serve as the substrate for hot film anemometers. By using a plasma-enhanced CVD process for the deposition of amorphous silicon carbide (a-SiC:H), the complete glass-ceramic substrate is covered with a 1 μm thick thin film, yielding a closed coating of the surface. The a-SiC:H layer can be patterned with a NF3/O2 gas mixture by a plasma assisted dry etch technology. After exposing the coated thin film sensors to the dynamic operation of a hydraulic test bench up to fuel pressures of 135 MPa, no failure of the passivation layer by delamination or cracking occurred.
Keywords :
amorphous semiconductors; anemometers; diamond; glass ceramics; passivation; plasma CVD; plasma CVD coatings; semiconductor thin films; sensors; silicon compounds; sputter etching; substrates; thin film devices; 1 micron; 135 MPa; C; LTC ceramics; LTCC; NF3; NF3-O2; NF3/O2 gas mixture; O2; SiC:H; a-SiC:H layer; amorphous SiC deposition; automotive injection system; ceramic substrates; diamond deposition; diamond-like coatings; glass-ceramic substrate; harsh environmental conditions; hot film anemometers; long-term reliable operation; long-term stable operation; low temperature cofired ceramics; passivation technology; plasma assisted dry etch technology; plasma-enhanced CVD process; thermal mass flow sensors; thin film sensors; Ceramics; Coatings; Passivation; Plasma applications; Plasma properties; Plasma temperature; Sensor phenomena and characterization; Substrates; Thermal sensors; Thin film sensors;
Conference_Titel :
Sensors, 2002. Proceedings of IEEE
Print_ISBN :
0-7803-7454-1
DOI :
10.1109/ICSENS.2002.1037172