DocumentCode :
3822445
Title :
CEI and IEE examinations
Author :
A.T. Parish;M.R. Mosely;Howard G. Tate;J.H.S. Craig
Author_Institution :
City University, Department of Electrical & Electronic Engineering, London, UK
Volume :
21
Issue :
12
fYear :
1975
fDate :
6/26/1975 12:00:00 AM
Firstpage :
750
Journal_Title :
Electronics and Power
Publisher :
iet
ISSN :
0013-5127
Type :
jour
DOI :
10.1049/ep.1975.0780
Filename :
5182115
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3822445
