Title :
System-level simulator for the W-CDMA low chip rate TDD system
Author :
Moon, Sung Ho ; Chung, Jae Hoon ; Kwon, Jae Kyun ; Park, Suwon ; Sung, Dan Keun ; Hwang, Sungoh ; Kim, Junggon
Author_Institution :
CNR Lab., KAIST, Daejeon, South Korea
Abstract :
A system-level simulator for the W-CDMA low chip rate TDD system is developed. This simulator considers multi-cell and multi-user environments and SIR-based power control. For accurate and reliable results, inner-cell and outer-cell interference is modeled by chip-level spreading and an SIR estimation scheme is used. From this simulator, system-level performance is evaluated in terms of the received SIR distributions for downlink and uplink. The degradation probability is also introduced as a QoS indicator at system level.
Keywords :
3G mobile communication; cellular radio; code division multiple access; parameter estimation; power control; probability; quality of service; radiofrequency interference; telecommunication control; time division multiplexing; 3GPP; QoS indicator; SIR estimation scheme; TDD system; W-CDMA; chip-level spreading; degradation probability; low chip rate; multicell environments; multiuser environments; power control; signal-to-interference ratio; Degradation; Downlink; Interference; Moon; Multiaccess communication; Power control; Power system modeling; Research and development; Standards development; Telecommunication standards;
Conference_Titel :
Vehicular Technology Conference, 2002. Proceedings. VTC 2002-Fall. 2002 IEEE 56th
Print_ISBN :
0-7803-7467-3
DOI :
10.1109/VETECF.2002.1040357
