DocumentCode :
3825202
Title :
Dinosaur egg
Volume :
46
Issue :
8
fYear :
2009
Firstpage :
16
Lastpage :
16
Keywords :
"Dinosaurs","Failure analysis","Microelectromechanical systems","Integrated circuit reliability","Micromechanical devices","Optical switches","Electrostatic discharge","Art","Microscopy","Tungsten"
Journal_Title :
IEEE Spectrum
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.2009.5186537
Filename :
5186537
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3825202