DocumentCode
3827905
Title
Author´s reply
Author
R.G. Bennetts
Author_Institution
Department of Electronics//University of Southhampton//Southampton, Hampshire S09 5NH, ENGLAND
Issue
2
fYear
1976
Keywords
"Fault trees","Combinational circuits","Turning","Frequency","Computer networks","Algorithm design and analysis","Automatic testing","Instruments","Circuit testing","Integrated circuit testing"
Journal_Title
IEEE Transactions on Reliability
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1976.5215007
Filename
5215007
Link To Document