مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3827906

Title :

Reply to Editorial

Author :

Richard J. Newell

Author_Institution :

NCR Corporation//Mitchell Road//Millsboro, Delaware 19966 USA.

Issue :

fYear :

1976

Firstpage :

127

Lastpage :

127

Keywords :

"Fault trees","Combinational circuits","Integrated circuits","Algorithm design and analysis","Editorials","Integrated circuit reliability"

Journal_Title :

IEEE Transactions on Reliability

Publisher :

ieee

ISSN :

0018-9529

Type :

jour

DOI :

10.1109/TR.1976.5215008

Filename :

5215008

Link To Document :