DocumentCode
3827906
Title
Reply to Editorial
Author
Richard J. Newell
Author_Institution
NCR Corporation//Mitchell Road//Millsboro, Delaware 19966 USA.
Issue
2
fYear
1976
Firstpage
127
Lastpage
127
Keywords
"Fault trees","Combinational circuits","Integrated circuits","Algorithm design and analysis","Editorials","Integrated circuit reliability"
Journal_Title
IEEE Transactions on Reliability
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1976.5215008
Filename
5215008
Link To Document