DocumentCode :
3828073
Title :
Authors´ reply
Author :
Young H. Kim;Kenneth E. Case;P. M. Ghare
Author_Institution :
Department of Industrial Management, Korea University, Seoul, Korea.
Issue :
4
fYear :
1973
Keywords :
"Reliability engineering","Telecommunication network reliability","Computer network reliability","Degradation","Operations research","Random variables","Reactive power","Communication networks","Computer networks"
Journal_Title :
IEEE Transactions on Reliability
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1973.5215904
Filename :
5215904
Link To Document :
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