DocumentCode
3828073
Title
Authors´ reply
Author
Young H. Kim;Kenneth E. Case;P. M. Ghare
Author_Institution
Department of Industrial Management, Korea University, Seoul, Korea.
Issue
4
fYear
1973
Keywords
"Reliability engineering","Telecommunication network reliability","Computer network reliability","Degradation","Operations research","Random variables","Reactive power","Communication networks","Computer networks"
Journal_Title
IEEE Transactions on Reliability
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1973.5215904
Filename
5215904
Link To Document