DocumentCode :
3828094
Title :
Preface
Author :
Gary L. Crellin
Author_Institution :
Applied Mathematics Laboratory, General Electric Co., Louisville, Ky.
Issue :
3
fYear :
1972
Firstpage :
127
Lastpage :
128
Keywords :
"Bayesian methods","Reliability theory","Decision theory","Parametric statistics","Educational institutions","Testing","Estimation theory","Standardization","Poisson equations","Hazards"
Journal_Title :
IEEE Transactions on Reliability
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1972.5215972
Filename :
5215972
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3828094
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